Open AccessThickness effect on sensing properties of pure Cu2O thin films under sub-ppm O3 levels
Author(s) -
S. Nacer,
A. Labidi,
S. Touihri,
Khalifa Aguir
Publication year - 2019
Publication title -
materials research express
Language(s) - English
Resource type - Journals
ISSN - 2053-1591
DOI - 10.1088/2053-1591/ab5bdd
Subject(s) - crystallinity , materials science , scanning electron microscope , adsorption , analytical chemistry (journal) , thin film , molecule , diffraction , ozone , electrode , conductivity , crystallography , chemistry , nanotechnology , optics , composite material , physics , organic chemistry , chromatography
The sub-ppm ozone (O 3 ) sensitivity of pure cuprous (Cu 2 O) thin films based sensors have been investigated by utilizing conductivity measurements at different temperatures varies from 150 to 200 °C. The structural and morphological properties of Cu 2 O sensitive layers have been investigated by the scanning electron microscope (SEM) and x-ray diffraction (XRD) respectively. The detection properties of Cu 2 O layers have been strongly altered by the electrode geometries and sensitive layer thickness. The sensors’ responses and structural investigations revealed that the ozone sensitivity has improved with the increase in the degree of crystallinity along the preferential direction (111). Ab-initio calculation shows that O 3 adsorption mechanism could be semi- dissociative of O 3 molecule on the Cu 2 O (111) surface, giving O 2 molecule remaining in interaction with the surface and an adsorbed oxygen O ads .