Open AccessRoot Cause Analysis of Cover Assembly Line of Clutch Plate
Author(s) -
M. Saravanakumar,
S. Murugapoopathi,
S. Sudhagar
Publication year - 2020
Publication title -
iop conference series. materials science and engineering
Language(s) - English
Resource type - Journals
eISSN - 1757-899X
pISSN - 1757-8981
DOI - 10.1088/1757-899x/988/1/012027
Subject(s) - clutch , diaphragm (acoustics) , root cause analysis , structural engineering , materials science , forensic engineering , engineering , automotive engineering , electrical engineering , loudspeaker
The cause and effect analysis mainly aims to reduce the consumer complaints with failure mode analysis and 8D principle. This work aims to reduce the run out defect percentage in clutch cover plate and most of the defects are produced due to run out. The overall defect observed from run out was usually 60-70%. The height difference between the fingers exceed the specified limit is named as run out defect for 18 finger diaphragm. The major parameters identified for measuring root-cause analysis of clutch plate are diaphragm finger uneven, diaphragm angle, diaphragm bi-cone height and diaphragm hardness. The root-cause defect was reduced by cause and effect method, 8 D analysis and 5W principle. The lean principle is employed in this work to utilize the men, material and resources with maximum efficiency. The lean principle reduces the waste and allows the company to supply the product in time with maximum accuracy.