Open AccessA review of methods on Condition Monitoring and Fault Diagnosis using IR Thermography–An Expert System approach
Author(s) -
Ch Vinay Kumar Reddy,
K. V. Ramana
Publication year - 2020
Publication title -
iop conference series. materials science and engineering
Language(s) - English
Resource type - Journals
eISSN - 1757-899X
pISSN - 1757-8981
DOI - 10.1088/1757-899x/981/4/042027
Subject(s) - thermography , reliability engineering , reliability (semiconductor) , fault (geology) , condition monitoring , expert system , computer science , condition based maintenance , process (computing) , preventive maintenance , engineering , artificial intelligence , infrared , physics , seismology , geology , optics , power (physics) , electrical engineering , quantum mechanics , operating system
Condition Monitoring is a process of checking faults in machinery. The main goal of Condition Monitoring is to check the health of critical components of machines and systems. In real situations during operation of machines decisions to be taken on maintenance are considered based on the condition. It has the benefits such as decreasing catastrophic failures, minimize the maintenance, operational and logistical cost, maximize the system security, availability and increasing the reliability. Different researchers use different methods for fault diagnosis. Every method has its own shortcomings. In this paper a study has been done on the Expert system to do condition monitoring and fault diagnosis using IR Thermography.