Modeling of non-contact atomic force microscope with two-term excitations | Zendy

Mohammad Reza Bahrami | Zendy

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Modeling of non-contact atomic force microscope with two-term excitations

Author(s) -

Mohammad Reza Bahrami

Publication year - 2020

Publication title -

iop conference series materials science and engineering

Language(s) - English

Resource type - Journals

eISSN - 1757-899X

pISSN - 1757-8981

DOI - 10.1088/1757-899x/971/4/042052

Subject(s) - cantilever , van der waals force , non contact atomic force microscopy , harmonic , amplitude , atomic force microscopy , electrostatic force microscope , atomic force acoustic microscopy , nonlinear system , kelvin probe force microscope , term (time) , force dynamics , classical mechanics , mechanics , excited state , microscope , physics , optics , materials science , acoustics , magnetic force microscope , nanotechnology , atomic physics , quantum mechanics , engineering , mechanical engineering , magnetization , molecule , magnetic field , composite material

The goal of this article is to study the dynamical behavior of atomic force microscope cantilever in its non-contact mode of operation. The lumped parameter model is used to construct the mathematical model of the cantilever. The tip of the cantilever is excited by two harmonic terms and is in interaction with the sample surface. The Van der Waals force, tip-sample interaction force, makes the system nonlinear. Using multiple scales method, the frequency response equation is found. The effects on the amplitude of excitations, the damping coefficient, and initial sample – tip distance is studied and presented as the results.

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