Open AccessTrack parameters investigate of oblique incident of alpha particles irradiated CR-39 detector
Author(s) -
Yasser Taha Khalil,
Mushtaq Abed Al-Jubbori
Publication year - 2020
Publication title -
iop conference series. materials science and engineering
Language(s) - English
Resource type - Journals
eISSN - 1757-899X
pISSN - 1757-8981
DOI - 10.1088/1757-899x/928/7/072132
Subject(s) - track (disk drive) , detector , alpha particle , oblique case , irradiation , optics , tracking (education) , materials science , particle (ecology) , cr 39 , physics , nuclear physics , analytical chemistry (journal) , chemistry , engineering , chromatography , mechanical engineering , psychology , pedagogy , linguistics , philosophy , oceanography , geology
In this work, the track etch-rate V T and etch-rate ratio V of CR-39 detector irradiated by alpha particles was investigated at different incident angles. The change of the track etch-rate and etch-rate ratio along the particle trajectories showed that these functions are not affected by the inclination of the particle trajectory with respect to the normal on the detector surface.