
Characteristics of Dielectric Behavior of Cu0.5Ti0.5TbxFe2-xO4 Ferrites
Author(s) -
Salma M. Shaban,
Bushra Salman Mahdi
Publication year - 2020
Publication title -
iop conference series. materials science and engineering
Language(s) - English
Resource type - Journals
eISSN - 1757-899X
pISSN - 1757-8981
DOI - 10.1088/1757-899x/928/7/072028
Subject(s) - dielectric , annealing (glass) , materials science , dielectric loss , activation energy , relaxation (psychology) , analytical chemistry (journal) , atmospheric temperature range , nuclear magnetic resonance , condensed matter physics , mineralogy , thermodynamics , metallurgy , chemistry , optoelectronics , physics , psychology , social psychology , chromatography
Cu 0.5 Ti 0.5 Tb x Fe 2-x O 4 samples were prepared by powder technology at different values of x (0, 0.03, 0.06, and 0.09). The behavior of dielectric constant studied within frequency range (100 Hz - 10 MHz)) at different annealing temperatures (298, 373, and 473) K. This studying indicated a fine behavior for dielectric constant with frequency range and annealing temperatures. The study of dielectric loss (tan δ) showed reducing of relaxation time and appearing different loss peaks with the variation of frequency and temperature. Also the activation energy which is related to relaxation time is calculated.