Open AccessSeparation of analytical signal for atomic-emission microwave plasma measurements
Author(s) -
В. В. Дроков,
В. В. Дроков,
A. D. Kazmirov,
A. V. Sinitskaya,
Н. А. Иванов,
A Y Hodunaev
Publication year - 2020
Publication title -
iop conference series. materials science and engineering
Language(s) - English
Resource type - Journals
eISSN - 1757-899X
pISSN - 1757-8981
DOI - 10.1088/1757-899x/860/1/012034
Subject(s) - signal (programming language) , atomic absorption spectroscopy , analytical chemistry (journal) , microwave , atomic emission spectroscopy , plasma , content (measure theory) , pulse (music) , materials science , sample (material) , chemistry , computational physics , optics , inductively coupled plasma , physics , mathematics , chromatography , mathematical analysis , quantum mechanics , detector , computer science , programming language
The analytical signal for atomic-emission microwave plasma (AEMP) spectral analysis method is studied. It is shown that the signal consists of two parts: background signal, proportional to content of the analytical element in a sample shaped by submicron particles and metalorganic compounds; pulse signal, proportional to content of analytical element in coarse discrete particles. The “dynamic discrimination” algorithm is suggested that allows measuring the element content in a liquid or powder ore sample independently of the content shape using AEMP method. It is shown that atomic absorption (AA) and AEMP measurements of Fe, Cu agree within error for samples both low and high in content of element in submicron particles.