
The quantitative analysis of several metal elements in a solution by the confocal X-ray fluorescence thin-sample approach
Author(s) -
Xuepeng Sun,
X Y Zhang,
Y. B. Wang,
Yijia Li,
Shang-Kun Shao,
Song Peng,
Huiquan Li,
Z G Liu,
Tao Sun
Publication year - 2020
Publication title -
iop conference series materials science and engineering
Language(s) - English
Resource type - Journals
eISSN - 1757-899X
pISSN - 1757-8981
DOI - 10.1088/1757-899x/770/1/012076
Subject(s) - confocal , fluorescence , x ray fluorescence , sample (material) , materials science , analytical chemistry (journal) , thin film , x ray , metal , confocal microscopy , sample preparation , chemistry , optics , nanotechnology , chromatography , metallurgy , physics
By a comprehensive combination of confocal X-ray fluorescence and thin-sample approach used in conventional X-ray fluorescence devices, a new “confocal equivalent thin-sample method” based on confocal X-ray fluorescence setup is proposed. It is used to quantify the concentration of several metal elements in a solution. Compared with the conventional X-ray fluorescence, this method could quantify the sample directly via the thin-sample approach and required not complicated sample preparing process. In the study, a liquid solution containing Cr, Mn, Fe, Co, Cu, Zn, As, Br, and Sr wase used to verify the proposed method.
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