Open AccessThe Influence of x ratio and Annealing Temperatures on Structural and Optical Properties for (CuO)x(ZnO)1-x Composite Thin Films Prepared by PLD
Author(s) -
Eman M. Nasir,
M. F. A. Alias,
Amjad Ali
Publication year - 2020
Publication title -
iop conference series. materials science and engineering
Language(s) - English
Resource type - Journals
eISSN - 1757-899X
pISSN - 1757-8981
DOI - 10.1088/1757-899x/757/1/012053
Subject(s) - materials science , wurtzite crystal structure , thin film , band gap , crystallite , annealing (glass) , refractive index , analytical chemistry (journal) , monoclinic crystal system , pulsed laser deposition , dielectric , hexagonal phase , molar absorptivity , composite number , hexagonal crystal system , optics , crystallography , nanotechnology , crystal structure , optoelectronics , composite material , chemistry , zinc , metallurgy , chromatography , physics
Thin films of (CuO) x (ZnO) 1-x composite were prepared by pulsed laser deposition technique and x ratio of 0≤ x ≤ 0.8 on clean corning glass substrate at room temperatures (RT) and annealed at 373 and 473K. The X-ray diffraction (XRD) analysis indicated that all prepared films have polycrystalline nature and the phase change from ZnO hexagonal wurtzite to CuO monoclinic structure with increasing x ratio. The deposited films were optically characterized by UV-VIS spectroscopy. The optical measurements showed that (CuO) x (ZnO) 1-x films have direct energy gap. The energy band gaps of prepared thin films decreased as x ratio increased, while they increased with increasing annealing temperatures. Also the optical constants such as refractive index, extinction coefficient and dielectric constants have been calculated.