Open AccessMicroscopy investigation of conical and layered nanowires
Author(s) -
D. A. Cherkasov,
D. V. Panov,
И. М. Долуденко,
Vladimir Mikhaylovich Kanevskiy,
А. Э. Муслимов,
D. L. Zagorskiy,
D. A. Biziaev,
А. А. Бухараев
Publication year - 2019
Publication title -
iop conference series. materials science and engineering
Language(s) - English
Resource type - Journals
eISSN - 1757-899X
pISSN - 1757-8981
DOI - 10.1088/1757-899x/699/1/012005
Subject(s) - nanowire , atomic force microscopy , conical surface , materials science , microscopy , nanostructure , nanotechnology , magnetic force microscope , scanning probe microscopy , composite material , optics , physics , magnetic field , magnetization , quantum mechanics
This article discusses the use of scanning microscopy in the study of one-dimensional nanostructures – nanowires. The nanowires were produced by matrix synthesis. Atomic force microscopy (AFM) of conical nanowires was carried out, and layered nanowires were investigated by AFM and magnetic force microscopy (MFM) methods.