Open AccessComputer simulation of special tomographic defectoscopy
Author(s) -
S. M. Zerkal,
N. P. Kislenko,
V. Yu Kornatskiy
Publication year - 2019
Publication title -
iop conference series. materials science and engineering
Language(s) - English
Resource type - Journals
eISSN - 1757-899X
pISSN - 1757-8981
DOI - 10.1088/1757-899x/687/2/022044
Subject(s) - projection (relational algebra) , object (grammar) , basis (linear algebra) , sample (material) , industrial computed tomography , matrix (chemical analysis) , tomography , computer science , algorithm , tomographic reconstruction , product (mathematics) , computer vision , artificial intelligence , iterative reconstruction , mathematics , optics , geometry , physics , materials science , composite material , thermodynamics
The paper proposes an algorithm for the reconstruction of the defect of the product on the basis of non-destructive testing, based on the use of a reference sample of the studied object. It solves the two-dimensional problem of industrial tomography, which consists in the restoration of the image of the defect based on the use of a reference sample. Assuming that inside the object there is a defect of a flat elongated structure, the width of which is much smaller than the diameter of the object, it becomes possible to implement a fairly economical algorithm for defect reconstruction, taking into account only those elements of the projection matrix that correspond to the rays, which significantly pass through the defect.