Open AccessReliability Design for Data Storage in an Integrated Test System
Author(s) -
Bing Zhang,
Xiao Sun,
Jian Shi,
Deng Rongjun
Publication year - 2019
Publication title -
iop conference series. materials science and engineering
Language(s) - English
Resource type - Journals
eISSN - 1757-899X
pISSN - 1757-8981
DOI - 10.1088/1757-899x/685/1/012005
Subject(s) - reliability (semiconductor) , computer science , reliability engineering , test (biology) , software , file system , database , operating system , engineering , paleontology , power (physics) , physics , quantum mechanics , biology
To solve the failing errors of prompting message and storing files which are occurred in a physical-files-receiving configuration software item installed on an Integrated Test System, some specific measures have been taken. The receiving-file software item is upgraded and tested. The upgraded item is validated by many different examples, and the results show that the reliability of the item is significantly improved.