Open AccessResearch on data consistency of LED based on temperature step stress acceleration test
Author(s) -
Jianguo Lin,
Yue Zhao,
Martín Carmen
Publication year - 2019
Publication title -
iop conference series. materials science and engineering
Language(s) - English
Resource type - Journals
eISSN - 1757-899X
pISSN - 1757-8981
DOI - 10.1088/1757-899x/631/5/052024
Subject(s) - reliability (semiconductor) , consistency (knowledge bases) , matlab , degradation (telecommunications) , trajectory , acceleration , stress (linguistics) , luminous flux , flux (metallurgy) , arrhenius equation , test data , computer science , path (computing) , reliability engineering , materials science , engineering , thermodynamics , physics , classical mechanics , artificial intelligence , telecommunications , light source , power (physics) , linguistics , philosophy , astronomy , kinetics , optics , metallurgy , programming language , operating system
At present, whether electronic equipment can maintain the reliability of modeling under different temperature conditions is an urgent problem to be solved. This paper studies LED under stepping temperature stress. Firstly, the luminous flux of LED method is established based on the Arrhenius temperature degradation path model. Secondly, the criterion of temperature step stress is determined., and then the MATLAB is used to select the distribution model which best fits the LED flux degradation trajectory. Finally, we check the consistency of the LED data, so as to realize the establishment of the LED flux degradation trajectory model. The result show that this model has high reliability and can calculate the normal life data of LED accurately.