Open AccessFailure Test Optimization Method of Silicon Pressure Sensor Based on Zero Failure Data
Author(s) -
Lei Zuo,
Hongyu Sun
Publication year - 2019
Publication title -
iop conference series. materials science and engineering
Language(s) - English
Resource type - Journals
eISSN - 1757-899X
pISSN - 1757-8981
DOI - 10.1088/1757-899x/626/1/012007
Subject(s) - reliability (semiconductor) , confidence interval , limit (mathematics) , reliability engineering , statistics , zero (linguistics) , test data , mathematics , failure rate , silicon , computer science , materials science , engineering , power (physics) , thermodynamics , physics , mathematical analysis , linguistics , philosophy , metallurgy , programming language
With the increasing reliability of the silicon pressure sensor, the phenomenon of zero-failure data often appears in the reliability test. This paper studies the optimal confidence limit method and distribution curve method to obtain the confidence coefficient-α and the constant-c(c>1) for the reliability analysis of zero-failure data of silicon pressure sensor, subsequently, the two methods were tested in different groups, by analyzing the influence of the number of test groups on the prediction analysis results, the optimal number of groups for the reliability prediction test of the silicon pressure sensor was obtained. The simulation results show that the best prediction results can be obtained when the confidence coefficient-α ∈ [0.3,0.6], c ∈ [4-6] and the number of groups is 10 to 13. This method improves the accuracy of failure rate estimation and reliability test efficiency with limited samples.