z-logo
open-access-imgOpen Access
Polycrystalline BiFeO3 thin films prepared by magnetic controlling sputtering method
Author(s) -
X. F. Liu,
W. G. Wang,
Jun Yin,
ChenYabei Wu,
J. X. Chen,
X. J. Wang
Publication year - 2019
Publication title -
iop conference series. materials science and engineering
Language(s) - English
Resource type - Journals
eISSN - 1757-899X
pISSN - 1757-8981
DOI - 10.1088/1757-899x/612/3/032025
Subject(s) - crystallite , materials science , annealing (glass) , sputter deposition , impurity , sputtering , thin film , optoelectronics , analytical chemistry (journal) , metallurgy , nanotechnology , chemistry , organic chemistry , chromatography
Polycrystalline BiFeO 3 films were fabricated by radio frequency magnetron sputtering using a Bi 1.1 FeO 3 target onto the glass and Si/SiO 2 /Ti/Pt substrates respectively. The samples which were annealed with different annealing conditions are pure without impurities. Our results indicate that there are relatively wider growth conditions for pure polycrystalline BFO phases.

The content you want is available to Zendy users.

Already have an account? Click here to sign in.
Having issues? You can contact us here