Open AccessIn-orbit Failure Analysis and Verification for Thermistors outside Satellites
Author(s) -
Bin Zhang,
Dongmei Wang,
Fan Yang,
Li Liu,
Zhao Peirong
Publication year - 2019
Publication title -
iop conference series. materials science and engineering
Language(s) - English
Resource type - Journals
eISSN - 1757-899X
pISSN - 1757-8981
DOI - 10.1088/1757-899x/608/1/012036
Subject(s) - thermistor , satellite , orbit (dynamics) , reliability (semiconductor) , resistor , fault tree analysis , thermal , environmental science , temperature measurement , temperature control , work (physics) , computer science , reliability engineering , aerospace engineering , engineering , meteorology , electrical engineering , physics , mechanical engineering , power (physics) , quantum mechanics , voltage
Satellite thermistor is used to measure the in-orbit temperature to support thermal control so that the on-board equipment can work in the appropriate temperature to get higer reliability and more life-time. In recent years, there have been several in-orbit failure events of thermistors outside the satellite, which have brought troubles to the thermal control of the whole satellite. In this paper, failure modes of in-orbit thermal resistors outside cabin are analyzed by fault tree, and ground simulation experiment is carried out by high-low temperature impact test. Fault cause is given according to test result and analysis.