
Analysis of Microstructure Characteristics of Overload Trace of Copper Conductor
Author(s) -
Liantie Wang,
Qi Zhou
Publication year - 2019
Publication title -
iop conference series. materials science and engineering
Language(s) - English
Resource type - Journals
eISSN - 1757-899X
pISSN - 1757-8981
DOI - 10.1088/1757-899x/585/1/012020
Subject(s) - equiaxed crystals , materials science , eutectic system , microstructure , metallurgy , dendrite (mathematics) , copper , conductor , microscope , metallography , aluminium , welding , composite material , optics , geometry , mathematics , physics