Open AccessDevelopment the Fourier analysis method of x-ray diffraction to calculate variables in crystal structure as well as calculation of some lattice parameters
Author(s) -
Sarab Saadi Jahil,
Khalid Hellal Harbbi
Publication year - 2019
Publication title -
iop conference series. materials science and engineering
Language(s) - English
Resource type - Journals
eISSN - 1757-899X
pISSN - 1757-8981
DOI - 10.1088/1757-899x/571/1/012112
Subject(s) - diffraction , fourier transform , fourier analysis , lattice constant , root mean square , fourier series , x ray crystallography , crystal structure , materials science , lattice (music) , condensed matter physics , crystallography , optics , mathematics , physics , mathematical analysis , chemistry , quantum mechanics , acoustics
The Fourier method was developed to calculate other important variables in the crystalline structure, such a strain, which is equal to 7.4828 x 10 −3 instead of the mean square strain and the energy density of the strain, which is equal to 2799614.7 dyne / cm 2 and the stress equal to 7.4828 x 10 8 dyne/cm 2 . The results obtained from the Fourier method for calculating other parameters of the manganese oxide lattice for each peak of x-ray diffraction peaks such as the texture coefficient, its mean value equal to 0. and the micro strains, which its mean value equal to 4.47 × 10 −3 dislocation density, its mean value are equal to 37.3 (lines .m −2 ) and the specific surface area its mean value is equal to 19,58432 of crystalline volume. A comparison was also made between the values of the square of strain and the apparent strain.