Open AccessReliability Evaluation of Transplanter Based on Weibull Model
Author(s) -
Changjun Wen,
Mian Wang,
Hongmei Li,
Hongliang Wang,
Liu Chang-lian
Publication year - 2019
Publication title -
iop conference series materials science and engineering
Language(s) - English
Resource type - Journals
eISSN - 1757-899X
pISSN - 1757-8981
DOI - 10.1088/1757-899x/569/5/052067
Subject(s) - weibull distribution , mathematics , linearization , reliability (semiconductor) , graph , probability density function , statistics , nonlinear system , power (physics) , physics , discrete mathematics , quantum mechanics
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