Open AccessIntelligent systems for monitoring and controlling chip formation when cutting difficult-to-machine materials
Author(s) -
В. В. Максаров,
V. E. Makhov
Publication year - 2019
Publication title -
iop conference series. materials science and engineering
Language(s) - English
Resource type - Journals
eISSN - 1757-899X
pISSN - 1757-8981
DOI - 10.1088/1757-899x/560/1/012028
Subject(s) - computer science , chip , detector , software , key (lock) , field (mathematics) , scheme (mathematics) , computer hardware , feature (linguistics) , machine vision , image processing , embedded system , real time computing , artificial intelligence , computer vision , image (mathematics) , telecommunications , mathematical analysis , linguistics , philosophy , computer security , mathematics , pure mathematics , programming language
This research addresses topical issues of creating industrial monitoring systems for chips, which are formed when materials are cut, based on light field-based optical detectors. A proposed scheme uses a light field (LF) method to register formed chips with an optical detector. An algorithms and monitoring methods for key geometric parameters of chip shapes are developed based on the analysis of images obtained from LF cameras. They feature digital image capturing and morphological analysis. For practical implementation of developed algorithms, National Instruments software platform is used. This research shows that the result accuracy in determining geometric characteristics of chips using the proposed solutions makes it possible to run diagnostics for cutting and material processing equipment.