Open AccessLife prediction of electric spindles with multiple degradation processes
Author(s) -
Yingzhi Zhang,
Jiang Cheng-zi,
Jialin Liu,
Song Min-qiao
Publication year - 2019
Publication title -
iop conference series. materials science and engineering
Language(s) - English
Resource type - Journals
eISSN - 1757-899X
pISSN - 1757-8981
DOI - 10.1088/1757-899x/544/1/012042
Subject(s) - degradation (telecommunications) , reliability (semiconductor) , computer science , reliability engineering , covariance , process (computing) , copula (linguistics) , engineering , mathematics , statistics , econometrics , power (physics) , physics , quantum mechanics , operating system , telecommunications