Open AccessThe Fresnel Coefficient of Thin Film Multilayer Using Transfer Matrix Method TMM
Author(s) -
Zahraa H. Mohammed
Publication year - 2019
Publication title -
iop conference series. materials science and engineering
Language(s) - English
Resource type - Journals
eISSN - 1757-899X
pISSN - 1757-8981
DOI - 10.1088/1757-899x/518/3/032026
Subject(s) - optics , fresnel equations , materials science , transfer matrix method (optics) , reflection coefficient , wavelength , attenuation coefficient , surface plasmon polariton , fresnel number , fresnel zone , planar , transmission coefficient , transverse plane , dielectric , surface plasmon , refractive index , plasmon , physics , transmission (telecommunications) , optoelectronics , diffraction , computer graphics (images) , electrical engineering , computer science , engineering , structural engineering
When the light incident on a multilayer planar mound, it is reflected, transmitted, and absorbed in the method that derived the Fresnel equations. The metal used in this work is the thin film of gold put on the glass. The properties of the preparation of waveform for dielectric charged surface Plasmon polariton structure of the bearing surface of the carrier plasma were studied using a simple transport matrix method(TMM), The Transfer Matrix Method (TMM) used to calculate the reflection, transmission & absorption for both TE (transverse wave) and TM (magnetic browser for the oblique incident plane wave. The relation between the incident angle with the Fresnel coefficient plotted at the different wavelength regimes (300nm,700nm,1200nm) was plotted using the program of the TMM written in Matlab (R2013). The best result for this Fresnel coefficient in the visible incident plane wave with wavelength = 700nm.