Open AccessMeasurement Affecting Errors in Digital Image Correlation
Author(s) -
V. V. Titkov,
S. V. Panin
Publication year - 2019
Publication title -
iop conference series. materials science and engineering
Language(s) - Uncategorized
Resource type - Journals
eISSN - 1757-899X
pISSN - 1757-8981
DOI - 10.1088/1757-899x/511/1/012018
Subject(s) - digital image correlation , reliability (semiconductor) , computer science , digital image , correlation , image (mathematics) , observational error , computer vision , image processing , statistics , optics , mathematics , physics , power (physics) , geometry , quantum mechanics