Open AccessFault correlation analysis-based framework for reliability deployment of electromechanical system
Author(s) -
Jiang Yuan,
Jianmin Gao,
Guojun Sun,
Rongxi Wang,
P F Zhang,
K Chen
Publication year - 2019
Publication title -
iop conference series. materials science and engineering
Language(s) - English
Resource type - Journals
eISSN - 1757-899X
pISSN - 1757-8981
DOI - 10.1088/1757-899x/504/1/012113
Subject(s) - fault tree analysis , reliability engineering , reliability (semiconductor) , failure mode and effects analysis , fault (geology) , component (thermodynamics) , computer science , process (computing) , tree (set theory) , quality (philosophy) , software deployment , engineering , mathematics , mathematical analysis , power (physics) , philosophy , physics , epistemology , quantum mechanics , seismology , thermodynamics , geology , operating system