Open AccessReliability prediction of electromechanical system concerned about correlation of multiple failures based on RFD
Author(s) -
D. Y.,
Guoxing Sun,
Jieping Gao,
Ruiqi Wang,
Peng Zhang,
K. Chen,
Z. Wang
Publication year - 2019
Publication title -
iop conference series. materials science and engineering
Language(s) - English
Resource type - Journals
eISSN - 1757-899X
pISSN - 1757-8981
DOI - 10.1088/1757-899x/504/1/012107
Subject(s) - reliability (semiconductor) , reliability engineering , correlation , computer science , boosting (machine learning) , engineering , mathematics , machine learning , power (physics) , physics , geometry , quantum mechanics