
Radiation hardness estimation in various temperature conditions under radiation impact
Author(s) -
Alexander S. Bakerenkov,
Alexander S. Rodin,
Vladislav A. Felitsyn,
В.С. Першенков
Publication year - 2019
Publication title -
iop conference series. materials science and engineering
Language(s) - Uncategorized
Resource type - Journals
eISSN - 1757-899X
pISSN - 1757-8981
DOI - 10.1088/1757-899x/498/1/012028
Subject(s) - radiation , comparator , radiation hardening , current (fluid) , degradation (telecommunications) , voltage , estimation , environmental science , materials science , biasing , computational physics , computer science , optoelectronics , mechanics , nuclear engineering , electronic engineering , physics , optics , electrical engineering , engineering , thermodynamics , systems engineering