Open AccessParametric and topological methods of bulk CMOS IP-blocks yield improvement
Author(s) -
Yu. M. Gerasimov,
N. G. Grigoryev,
A V Kobylyatskiy
Publication year - 2019
Publication title -
iop conference series. materials science and engineering
Language(s) - English
Resource type - Journals
eISSN - 1757-899X
pISSN - 1757-8981
DOI - 10.1088/1757-899x/498/1/012024
Subject(s) - parametric statistics , yield (engineering) , cmos , nanometre , topology (electrical circuits) , basis (linear algebra) , electronic engineering , materials science , computer science , mathematics , engineering , electrical engineering , statistics , geometry , composite material