
Raman Scattering Study of Silicon Carbide Irradiated with 1.25 MeV Si Ions
Author(s) -
Pengfei Wang,
Shuai Wang
Publication year - 2019
Publication title -
iop conference series. materials science and engineering
Language(s) - English
Resource type - Journals
eISSN - 1757-899X
pISSN - 1757-8981
DOI - 10.1088/1757-899x/493/1/012092
Subject(s) - irradiation , raman spectroscopy , materials science , raman scattering , annealing (glass) , ion , fluence , graphite , amorphous solid , silicon carbide , silicon , analytical chemistry (journal) , carbide , crystallography , chemistry , optics , metallurgy , physics , organic chemistry , chromatography , nuclear physics