Open AccessXPS studies of charging effect induced by X-ray irradiation on amorphous SiO2 thin films
Author(s) -
Dai Peng Xing,
Hui Zeng,
Wen Xu Zhang,
Wan Li Zhang
Publication year - 2019
Publication title -
iop conference series. materials science and engineering
Language(s) - English
Resource type - Journals
eISSN - 1757-899X
pISSN - 1757-8981
DOI - 10.1088/1757-899x/490/2/022079
Subject(s) - x ray photoelectron spectroscopy , irradiation , amorphous solid , thin film , materials science , saturation (graph theory) , analytical chemistry (journal) , chemical engineering , nanotechnology , chemistry , crystallography , physics , nuclear physics , engineering , mathematics , chromatography , combinatorics