Open AccessClarification the reliability of electronic components used in nuclear industry
Author(s) -
Dmitry Sergeevich Samokhin,
T. N. Leonova,
Mohammad Alslman,
A. D. Vostrilova
Publication year - 2019
Publication title -
iop conference series. materials science and engineering
Language(s) - English
Resource type - Journals
eISSN - 1757-899X
pISSN - 1757-8981
DOI - 10.1088/1757-899x/487/1/012006
Subject(s) - reliability engineering , reliability (semiconductor) , failure rate , computer science , product (mathematics) , electronic equipment , reduction (mathematics) , work (physics) , engineering , mechanical engineering , mathematics , power (physics) , physics , geometry , quantum mechanics , computer hardware