
Simulations of electrical properties of cylindrical 3d-trench electrical si detectors under different radiation fluences and mip incident position
Author(s) -
Fenglan Kuang,
Z Li,
Zhilin Long,
M W Liu
Publication year - 2019
Publication title -
iop conference series. materials science and engineering
Language(s) - English
Resource type - Journals
eISSN - 1757-899X
pISSN - 1757-8981
DOI - 10.1088/1757-899x/479/1/012029
Subject(s) - fluence , detector , irradiation , particle detector , radiation , charge (physics) , optics , position (finance) , trapping , physics , radiation damage , materials science , optoelectronics , atomic physics , nuclear physics , finance , economics , ecology , quantum mechanics , biology