Open AccessPower Integrity Analysis of Low Power SOC Design
Author(s) -
Yang Wu,
Xin He,
Deng Jun,
Keliu Hu,
Kun Huang,
Yiru Fu
Publication year - 2018
Publication title -
iop conference series. materials science and engineering
Language(s) - English
Resource type - Journals
eISSN - 1757-899X
pISSN - 1757-8981
DOI - 10.1088/1757-899x/466/1/012060
Subject(s) - power integrity , power (physics) , power gating , power analysis , power optimization , dynamic demand , signal integrity , computer science , reliability engineering , engineering , electronic engineering , electrical engineering , voltage , power consumption , physics , transistor , quantum mechanics , printed circuit board