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Defect depth effect on the reflection coefficient of an open-ended coaxial sensor
Author(s) -
Hichem Amar,
Hatem Ghodbane,
Mounir Amir,
T. Bouziane,
Abderrahmane Younes
Publication year - 2018
Publication title -
iop conference series. materials science and engineering
Language(s) - English
Resource type - Journals
eISSN - 1757-899X
pISSN - 1757-8981
DOI - 10.1088/1757-899x/454/1/012072
Subject(s) - reflection coefficient , network analyzer (electrical) , coaxial , reflection (computer programming) , optics , materials science , acoustics , electrical conductor , dielectric , frequency band , electrical engineering , optoelectronics , physics , antenna (radio) , engineering , composite material , computer science , programming language

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