
Development of a Wireless Dynamic Test Device for Low Strain Integrity Testing and Parallel Seismic Testing of Foundation Piles
Author(s) -
Peng Zhang,
Kuihua Wang
Publication year - 2018
Publication title -
iop conference series. materials science and engineering
Language(s) - English
Resource type - Journals
eISSN - 1757-899X
pISSN - 1757-8981
DOI - 10.1088/1757-899x/439/5/052037
Subject(s) - wireless , reliability (semiconductor) , dynamic testing , computer science , foundation (evidence) , engineering , structural engineering , telecommunications , archaeology , history , power (physics) , physics , quantum mechanics