Open AccessBehavior of SiC MOSFET under Short-Circuit during the On-State
Author(s) -
Meng Cui,
Jinyuan Li,
Yi Du,
Zhibin Zhao
Publication year - 2018
Publication title -
iop conference series. materials science and engineering
Language(s) - English
Resource type - Journals
eISSN - 1757-899X
pISSN - 1757-8981
DOI - 10.1088/1757-899x/439/2/022026
Subject(s) - mosfet , capacitance , materials science , voltage , electrical engineering , electronic engineering , optoelectronics , engineering , transistor , physics , electrode , quantum mechanics