
Effect of annealing temperature on construction of CuO layer on electrodeposited-Cu2O layer by annealing
Author(s) -
S. M. Zainal,
M.Z.M. Zamzuri,
M. Hasnulhadi,
Z. Nooraizedfiza,
M. Marina,
Fariza Mohamad,
N. Hisyamudin,
Masanobu Izaki
Publication year - 2018
Publication title -
iop conference series. materials science and engineering
Language(s) - English
Resource type - Journals
eISSN - 1757-899X
pISSN - 1757-8981
DOI - 10.1088/1757-899x/429/1/012097
Subject(s) - annealing (glass) , materials science , copper , aqueous solution , atomic force microscopy , optical microscope , chemical engineering , grain size , layer (electronics) , metallurgy , analytical chemistry (journal) , crystallography , composite material , nanotechnology , scanning electron microscope , chemistry , chromatography , engineering