Open AccessResearch on Reliability Evaluation Method of AC/DC Hybrid Micro-Grid
Author(s) -
Xiaogang Hou,
Xiaoyun Qu,
Lingfeng Kou,
Yihu Xu,
Lei Sun,
Haijun Liu
Publication year - 2018
Publication title -
iop conference series. materials science and engineering
Language(s) - English
Resource type - Journals
eISSN - 1757-899X
pISSN - 1757-8981
DOI - 10.1088/1757-899x/394/4/042086
Subject(s) - reliability (semiconductor) , grid , computer science , monte carlo method , power (physics) , electronic engineering , reliability engineering , engineering , mathematics , physics , statistics , geometry , quantum mechanics