Open AccessResearch on Short-Term Reliability of Master Slave Control Based on Running Microgrid
Author(s) -
Peng Gu,
Shuai Yuan,
Zhen Yang,
Jun Li,
Aikun Ma,
Yuting Wang,
Bo Hong,
Lei Yuan
Publication year - 2018
Publication title -
iop conference series. materials science and engineering
Language(s) - English
Resource type - Journals
eISSN - 1757-899X
pISSN - 1757-8981
DOI - 10.1088/1757-899x/394/4/042013
Subject(s) - microgrid , reliability (semiconductor) , reliability engineering , redundancy (engineering) , computer science , fault tree analysis , term (time) , process (computing) , power (physics) , point (geometry) , control theory (sociology) , control (management) , engineering , mathematics , physics , geometry , quantum mechanics , artificial intelligence , operating system