Open AccessReliability and Safety Analysis on Multi-state System of EMUs with Degraded Components
Author(s) -
Xingdong Zhao,
Kexin Zhang,
Zhiyao Zhao,
Ce Liang
Publication year - 2018
Publication title -
iop conference series. materials science and engineering
Language(s) - English
Resource type - Journals
eISSN - 1757-899X
pISSN - 1757-8981
DOI - 10.1088/1757-899x/394/3/032137
Subject(s) - reliability block diagram , reliability engineering , reliability (semiconductor) , computer science , state (computer science) , fault tree analysis , engineering , algorithm , power (physics) , physics , quantum mechanics