Open AccessAutomated line integration from through hole technology to integrated circuit testing
Author(s) -
Roshan Abraham Joseph,
Sakthivel Gandhi
Publication year - 2018
Publication title -
iop conference series. materials science and engineering
Language(s) - English
Resource type - Journals
eISSN - 1757-899X
pISSN - 1757-8981
DOI - 10.1088/1757-899x/390/1/012104
Subject(s) - line (geometry) , integration testing , integrated circuit , computer science , engineering , electrical engineering , operating system , software , geometry , mathematics