Open AccessModern technologies of X-ray systems for control of electronic components
Author(s) -
Н. Н. Потрахов,
В. Б. Бессонов,
A. V. Obodovskiy,
A. Yu. Gryaznov,
K. K. Guk,
Н. Е. Староверов
Publication year - 2018
Publication title -
iop conference series. materials science and engineering
Language(s) - English
Resource type - Journals
eISSN - 1757-899X
pISSN - 1757-8981
DOI - 10.1088/1757-899x/387/1/012061
Subject(s) - microelectronics , key (lock) , systems engineering , control (management) , quality (philosophy) , computer science , electronics , engineering , electrical engineering , physics , operating system , quantum mechanics , artificial intelligence