Open AccessTransmission Kikuchi diffraction from nano-crystalline Ti and TiN thin-films
Author(s) -
Tarang Mungole,
J. Zhang,
Bilal Mansoor,
Georges Ayoub,
David P. Field
Publication year - 2018
Publication title -
iop conference series. materials science and engineering
Language(s) - English
Resource type - Journals
eISSN - 1757-899X
pISSN - 1757-8981
DOI - 10.1088/1757-899x/375/1/012009
Subject(s) - selected area diffraction , materials science , electron backscatter diffraction , scanning electron microscope , texture (cosmology) , transmission electron microscopy , diffraction , optics , thin film , electron diffraction , kikuchi line , tin , high resolution transmission electron microscopy , reflection high energy electron diffraction , optoelectronics , nanotechnology , composite material , metallurgy , computer science , physics , image (mathematics) , artificial intelligence