
A review of EBSD: from rudimentary on line orientation measurements to high resolution elastic strain measurements over the past 30 years.
Author(s) -
David J. Dingley,
Graham Meaden,
David J. Dingley,
A. P. Day
Publication year - 2018
Publication title -
iop conference series. materials science and engineering
Language(s) - English
Resource type - Journals
eISSN - 1757-899X
pISSN - 1757-8981
DOI - 10.1088/1757-899x/375/1/012003
Subject(s) - electron backscatter diffraction , dislocation , materials science , tetragonal crystal system , diffraction , strain (injury) , crystallography , optics , condensed matter physics , composite material , physics , chemistry , crystal structure , medicine