Open AccessNumerical Simulation Studies on the Influence of Metallurgical Contamination on the Electric Field of RTV Coating
Author(s) -
Yang Shen,
Lin Mu,
Xiaoqing Yuan,
Wang Xiao,
Kai Zhou,
Jing Yan,
Lei Hao,
Ji Li
Publication year - 2018
Publication title -
iop conference series. materials science and engineering
Language(s) - English
Resource type - Journals
eISSN - 1757-899X
pISSN - 1757-8981
DOI - 10.1088/1757-899x/366/1/012071
Subject(s) - contamination , coating , electric field , materials science , metallurgy , layer (electronics) , conductor , insulator (electricity) , electrical conductor , surface layer , composite material , ecology , physics , quantum mechanics , biology