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Reliability Modeling of Double Beam Bridge Crane
Author(s) -
Zhu Han,
Yifei Tong,
Jiahui Luan,
Xiangdong Li
Publication year - 2018
Publication title -
iop conference series. materials science and engineering
Language(s) - English
Resource type - Journals
eISSN - 1757-899X
pISSN - 1757-8981
DOI - 10.1088/1757-899x/362/1/012028
Subject(s) - bridge (graph theory) , beam (structure) , reliability (semiconductor) , structural engineering , division (mathematics) , beam bridge , engineering , computer science , physics , mathematics , span (engineering) , medicine , power (physics) , arithmetic , quantum mechanics

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