Open AccessStatistical Bayesian method for reliability evaluation based on ADT data
Author(s) -
Dawei Lu,
Lizhi Wang,
Yusheng Sun,
Xiaohong Wang
Publication year - 2018
Publication title -
iop conference series. materials science and engineering
Language(s) - English
Resource type - Journals
eISSN - 1757-899X
pISSN - 1757-8981
DOI - 10.1088/1757-899x/351/1/012008
Subject(s) - reliability (semiconductor) , bayesian probability , computer science , reliability engineering , statistics , data mining , artificial intelligence , mathematics , engineering , power (physics) , physics , quantum mechanics