Open AccessEvaluation of band gap energy and surface roughness for tin indium zinc oxide thin films by atomic force microscopy and electron spectroscopy
Author(s) -
Yus Rama Denny,
Teguh Firmansyah,
Isnaeni Isnaeni,
Sovian Aritonang,
AM Kartina
Publication year - 2018
Publication title -
iop conference series. materials science and engineering
Language(s) - English
Resource type - Journals
eISSN - 1757-899X
pISSN - 1757-8981
DOI - 10.1088/1757-899x/343/1/012006
Subject(s) - band gap , materials science , thin film , surface roughness , indium tin oxide , analytical chemistry (journal) , scanning electron microscope , surface finish , indium , sputter deposition , spectroscopy , optics , optoelectronics , sputtering , chemistry , nanotechnology , composite material , physics , chromatography , quantum mechanics