Open AccessAging analysis of high performance FinFET flip-flop under Dynamic NBTI simulation configuration
Author(s) -
M. F. Zainudin,
Hanim Hussin,
Abdul Karimi Halim,
Jamilah Karim
Publication year - 2018
Publication title -
iop conference series. materials science and engineering
Language(s) - English
Resource type - Journals
eISSN - 1757-899X
pISSN - 1757-8981
DOI - 10.1088/1757-899x/341/1/012012
Subject(s) - negative bias temperature instability , flip flop , robustness (evolution) , reliability (semiconductor) , degradation (telecommunications) , electronic engineering , dynamic stress , power (physics) , computer science , materials science , mosfet , electrical engineering , cmos , engineering , voltage , transistor , dynamic loading , biochemistry , chemistry , physics , quantum mechanics , gene , operating system