Open AccessRectangular microstrip antenna with corrugation like defects at radiating edge: A new approach to reduce cross polarization radiation
Author(s) -
Umesh Ankush Pawar,
Debasish Mondal,
A. Nagaraju,
Subhradeep Chakraborty,
L. Lolit Kumar Singh,
Sudipta Chattopadhyay
Publication year - 2018
Publication title -
iop conference series. materials science and engineering
Language(s) - English
Resource type - Journals
eISSN - 1757-899X
pISSN - 1757-8981
DOI - 10.1088/1757-899x/331/1/012029
Subject(s) - ground plane , radiation , microstrip , patch antenna , microstrip antenna , optics , materials science , radiation pattern , enhanced data rates for gsm evolution , bandwidth (computing) , linear polarization , radiation properties , polarization (electrochemistry) , antenna (radio) , optoelectronics , acoustics , physics , telecommunications , computer science , laser , chemistry
In this paper, single layer, simple and compact RMA, with corrugation like defects at the radiating edge, is studied thoroughly to reduce XP radiation from the patch. Unlike the earlier works reported on defected ground structure integrated patches and defect patch structures, in this work, corrugation like linear defects have been placed at the radiating edges of the patch to reduce cross polarisation radiation. Around 30-40 dB of CP-XP isolation is observed in H-plane with 7% impedance bandwidth and in E-plane also, more than 55 dB CP-XP isolation is found. The proposed structure is very simple to design and easy to fabricate.