Open AccessModified SPC for short run test and measurement process in multi-stations
Author(s) -
Chin Kok Koh,
Chin Jeng Feng,
Shahrul Kamaruddin
Publication year - 2018
Publication title -
iop conference series. materials science and engineering
Language(s) - English
Resource type - Journals
eISSN - 1757-899X
pISSN - 1757-8981
DOI - 10.1088/1757-899x/328/1/012009
Subject(s) - control chart , statistical process control , guard (computer science) , reliability engineering , computer science , control limits , chart , process (computing) , sensitivity (control systems) , real time computing , engineering , statistics , mathematics , electronic engineering , operating system , programming language